Sitemap   |  Contact  |  Home  |  中文  |  CAS
ABOUT US
 
RESEARCH
 
PEOPLE
 
POSITIONS AVAILABLE
News & Events
  Events
  Upcoming Events
  Location:Home > News & Events > Upcoming Events
Surface analysis in the semiconductor industry: Present need and future directions
Author:
Update time: 2019-11-28
Close Text Size: A A A Print

Speaker: Dr. Thierry Conard, Interuniversity Microelectronics Centre (IMEC)
Time
Thursday,14:00 p.m., 28th November
Place
Room210,Shangshanyuan
Sponsor
Prof. DING Sunan

 
Biography:

Thierry Conard obtained his PhD in 1994 on the growth and characterization by electron spectroscopies of epitaxial copper oxide from the University of Namur in Belgium. He then joined Waseda University in Tokyo, Japan for 2 years where he continued his work on electron spectroscopies on hexagonal Boron Nitride.

In 1996 he started in Imec as a researcher on XPS and TOF-SIMS, in charge of building the service activities in these domains for supporting the imec process development in the area of semiconductor technology. In 2005 he became team leader from the team responsible of the photoemission (including synchrotron), TOFSIMS, EDS (SEM) and AES activities as a service. In this time he also continued his research activities in surface science and the development of surface science as a metrology techniques, focusing among other on Angle resolved XPS and introducing 3D-TOFSIMS and HAXPES in Imec. This leads to about 300 publications as author or co-author and he became Principle Member of Technical Staff function in 2019.

NEWS & EVENTS
 
INTERNATIONAL COOPERATION
 
EDUCATION & TRAINING
 
RESOURCES
Copyright ©2008-2011 Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), CAS
Address: 398 Ruoshui Road, SEID, SIP, Suzhou, 215123, China|Tel:+86512 6287 2509|Fax:+86512 6260 3079|Email: administrator@sinano.ac.cn