Faculty
QIU Yongxin / 邱永鑫
  • Department:Platform for Characterization & Test
  • Position:Senior Engineer
  • Expertise:X-ray diffraction; Semiconductor materials
  • Email:yxqiu2008@sinano.ac.cn
Research Interest
1.  Growth and Properties of III-V semiconductors,

2.  Analysis of Materials structure.

Experience:
Employment

Nov. 2008 - Present 

 Senior Engineer 

Platform for Characterization &Test , SINANO, CAS 

Jul1994 - Jul. 2001 

Engineer

Northeast Light Alloy Co., Ltd. China

Education

Ph.D. 2008 

Material Physics &. Chemistry 

Harbin Institute of Technology

B.S. 1993 

Physics

Lanzhou Univercity 

Selected Publication:
  1. Xiong, M. Li, M. C. Qiu, Y. X. Zhao, Y. Wang, L.Zhao, L. C.  Investigation of antimony for arsenic exchange at the GaSb covered GaAs (001) surface,Physica Status Solidi B-Basic Solid State Physics,247(2),303-307(2010)
  2. Qiu, Y. X. Li, M. C. Xiong, M. Zhang, B. S. Liu, G. J. Zhao, L. C. Sb/As Exchange at the Interface of Heterostructures, Rare Metal Materials and Engineering 38(11), 1983-1986(2009)
  3. J Q Liu, Y X Qiu, J F Wang, X Guo, K Huang, K Xu, H Yang, High-resolution X-ray diffraction Studies of highly curved GaN layers prepared by Hydride Vapor Phase Epitaxy, Photonics and Optoelectronecs Meetings(POEM)2009; Proc. of SPIE 7518(2009)
  4. Li, M. C. Qiu, Y. X. Liu, G. J. Wang, Y. T. Zhang, B. S. Zhao, Distribution of dislocations in GaSb and InSb epilayers grown on GaAs (001) vicinal substrates, L. C. Journal of Applied Physics, 105(9), 094903-1(2009)
  5. Yongxin Qiu, Meicheng Li, Guojun Liu, Yutian Wang, Baoshun Zhang, Yong Wang, Liancheng Zhao,―Investigation of crystallographic tilting in GaSb/GaAs heteroepitaxial structures by high resolution X-ray diffraction, Journal of Crystal Growth, 308:325–329(2007)
  6. Yongxin Qiu, Meicheng Li, Yutian Wang, Baoshun Zhang, Yong Wang, Guojun Liu, Liancheng Zhao, Investigation of GaSb epilayer grown on vicinal GaAs(001) substrate by high resolution X-ray diffraction, Physica Scripta, T129:27-30 (2007)