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R. X. Wang, X. M. Tao, Y. Wang, G. F. Wang, and S. M. Shang, “Microstructures and electrical conductance of silver nanocrystalline thin films on flexible polymer substrates”, Surface and Coatings Technology, 204, 1206-1210 (2010).
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R. X. Wang, X. M. Tao, Y. Wang, and G. F. Wang, “Electrical Properties and Fatigue Resistance of Polyamide 6,6 Fabrics with Nanocrystal Silver Coating”, Journal of Nanoscience and Nanotechnology, 9, 3062-3066 (2009)
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G. F. Wang, X. M. Tao, and R. X. Wang, “Flexible organic light-emitting diodes with a polymeric nanocomposite anode”, Nanotechnology, 19, 145201 (2008).
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A. Yang, X. M. Tao, R. X. Wang, S. C. Lee, and C. Surya, “Room temperature gas sensing properties of SnO2/multiwall-carbon-nanotube composite nanofibers”, Applied Physics Letters, 91, 133110 (2007).
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R. X. Wang, S. J. Xu, S. L. Shi, C. D. Beling, S. Fung, D. G. Zhao, H. Yang, and X. M. Tao, “Probing deep level centers in GaN epilayers with variable-frequency capacitance-voltage characteristics of Au/GaN Schottky contacts”, Applied Physics Letters, 89, 143503 (2006)
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R. X. Wang, S. J. Xu, A. B. Djuri?i?, C. D. Beling, C. K. Cheung, C. H. Cheung, S. Fung, D. G. Zhao, H. Yang, and X. M. Tao, “Influence of ITO thin-film quality on reverse leakage current of ITO/n-GaN Schottky contacts”, Applied Physics Letters, 89, 033503 (2006).
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R. X. Wang, C. D. Beling, S. Fung, A. B. Djuri?i?, C. C, Ling, and S. Li, “Influence of gaseous annealing environment on the properties of indium tin oxide thin films”, Journal Applied Physics, 97, 033504-1-5 (2005).
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R. X. Wang, C. D. Beling, S. Fung, A. B. Djuri?i?, C. C. Ling, C. Kwong, and S. Li, “Influence of annealing temperature and environment on the properties of indium tin oxide thin films”, Journal of Physics D-Applied Physics, 38, 2000-2005 (2005).
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R. X. Wang, C. D. Beling, A. B. Djuri?i?, S. Li and S Fung, “Properties of ITO Thin Films Deposited on Amorphous and Crystalline Substrates with E-Beam Evaporation”, Semiconductor Science and Technology, 19, 695-698 (2004).
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R. X. Wang, Y. Zohar, M. Wong, “Residual stress-loaded titanium-nickel shape-memory alloy thin-film micro-actuators”, Journal of Micromechanics and Microengineering, 12, 323-327 (2002).